EMC testing

Analysis & Measurement

In our EMC laboratory, a wide variety of EMC tests can be carried out for the immunity and emitted interference of DUTs. The results are used to determine whether your device meets the requirements for CE marking. If the device under testing does not meet these requirements, appropriate measures are defined.

Mobile analyzers and measuring equipment are available for field measurements.

 

Tests for immunity to interference

Electrostatic discharges with ESD generators on the surface of the housing
Origin: Electrostatic discharge due to contact with persons
Standards: EN 61000-4-2
Influences due to high-frequency irradiation up to 6 GHz with generators, HF amplifiers in a full-absorption hall with 3 m measuring distance
(frequency range: 80 MHz – 6 GHz | amplifier powers: 50 W – 500 W | field strengths at 3 m measuring distance up to 1 GHz ≤ 20 V/m | field strengths at 3 m measuring distance up to 6 GHz ≤ 10 V/m)
Origin: voice radios, cell phones, and other RF sources that generate RF radiation.
Standards:
EN 61000-4-3
Coupling of fast transients (burst) on supply and signal lines
Origin: switching of inductive loads | bouncing of relay contacts
Standards: EN 61000-4-4
Coupling of surge voltages (surge) with hybrid generators
Origin: short circuits or switching operations in the supply network or indirect lightning effects
Standards: EN 61000-4-5
Conducted high frequency injection unbalanced with generators, amplifiers and coupling devices
Origin: Conducted disturbances induced by high-frequency fields.
Standards: EN 61000-4-6
Magnetic fields with power frequency with coupling coils
Origin: high-current sources that generate large magnetic fields.
Standards: EN 61000-4-8
Network supply influences, such as voltage fluctuations and brief interruptions with the aid of a supply simulator
Origin: dips and fluctuations of supply voltages
Standards: EN 61000-4-11
Measurement of radio interference, interference power on lines as well as radio field strength with measuring receiver, antennas and full absorber hall
Origin: Wherever high-frequency energy is generated, e.g. clocks of processors, clock rates of switching power supplies
Standards: EN 55011 | EN 55022 | EN 55014 a. o.

Tests for the emission of interference

Conducted: 9kHz to 30 MHz
Standards: EN 55011 | EN 55022 a. o.
Radiated: 30 MHz to 7 GHz
Standards: EN 55011 | EN 55022 a. o.
Interference power measurement with MDS coupling clamp 30 MHz to 300 MHz
Standards: EN 55014 a. o.
Flicker measurements
Standards: EN 61000-3-3
Measurements of harmonics
Standards: EN 61000-3-2

Contact:

Josip Horvat
Division Manager EMC Laboratory

Fon: +49 (7172) 926 13-33
Mail: josip.horvat@baudisch.de

Carsten Hampel
EMV-Expert
Fon: +49 (7172) 926 13-34
Mail: carsten.hampel@baudisch.de

 

Baudisch Electronic GmbH

Im Gewerbegebiet 19
73116 Wäschenbeuren

T: +49 (7172) 9 26 13-0
E: vertrieb@baudisch.de

Newsletter subscription

Logo of Baudisch Electronic

Baudisch Electronic GmbH

Im Gewerbegebiet 19
73116 Wäschenbeuren

T: +49 (7172) 9 26 13-0
E: vertrieb@baudisch.de

Newsletter subscription